Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization

the scanning electron microscope

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...

Millimeter-wave scanning near-field microscope using a resonant waveguide probe

We demonstrate a millimeter-wave surface imaging technique using a near-field scanning millimeter-wave microscope with a resonant standard waveguide probe. The metallic probe tip in the resonant waveguide was designed to couple energy into and out of the resonant waveguide. By measuring the shift of the resonant frequency and the change of the quality factor in the near-field zone, we obtained ...

Near-field Scanning Optical Microscope Platform

Scanning Near-field Raman Spectroscopic Microscope

Near-field scanning optical microscope probe analysis.

In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for dail...